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JEOL JEM 2100F |
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The JEOL 2100F with CEOS GmbH hexapole STEM probe corrector: This instrument is an advanced field emission electron microscope with an accelerating voltage of 80 to 200kV.
- Schottky Field Emission Gun
- TEM point resolution 0.19nm
- STEM probe size < 0.1nm
- Oxford Instruments x-sight EDS detector
- Gatan Tridiem Imaging Filter
- Gatan Ultrascan 2k*2K camera
- Spectral Imaging for both EELS and EDS
- Fischione HA-ADF detector
- Piezo-stage for precise positioning
- SIRIUS remote control system
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