Zeiss Ultraplus Thermal Field Emission Scanning Electron Microscope
Zeiss Ultraplus Thermal Field Emission Scanning Electron Microscope is a high vacuum, high resolution scanning electron microscope with the capability for EDS and is equipped with a Nabity e-beam lithography system. The equipment is outfitted with a charge compensator for non-conductive specimen imaging and a STEM detector. The instrument also has the following detectors: In-lens detector, EsB detector, AsB detector, an Everhart-Thornley detector, and a CCD camera with infrared illumination.
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